M2 Ø1.5 mm silicon nitride ball, stainless steel stem, L 10 mm, EWL 4.5 mm A-5004-1918 CAL16 B2 Accuracy metric :

Accuracy metric :

Maximum Permissible Error J MPE: ±1 µm

rubberized knob easily engages and disengages the sample

04 inch/s) Stylus tip radius 90°/5µm (200µinch) Detector measuring force 4mN External I/O USB I/F

Inspec Digital Micrometer 132-07-830 Range 150-175mm/6-7" Resolution

M2 Ø1.5 mm silicon nitride ball, stainless steel stem, L 10 mm, EWL 4.5 mm A-5004-1918 CAL16 B2 Accuracy metric :Renishaw M2 Straight Styli with Silicon Nitride ball Straight styli are designed to inspect simple features where direct, unobstructed contact with a measured surface is possible. A tungsten carbide stem provides exceptional rigidity, particularly for styli with small ball and stem diameters. Silicon nitride is similar to ruby in terms of its physical properties. Its lower coefficient of friction makes it ideal for use with most scanning applications,